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HomeMaterials Science ForumMaterials Science Forum Vols. 353-356Charged Particle Detection Properties of Epitaxial...

Charged Particle Detection Properties of Epitaxial 4H-SiC Schottky Diodes

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Silicon Carbide and Related Materials 2000

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Periodical:

Materials Science Forum (Volumes 353-356)

Pages:

757-762

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.353-356.757

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Online since:

January 2001

Authors:

Filippo Nava, P. Vanni, G. Verzellesi, Antonio Castaldini, Anna Cavallini, L. Polenta, Roberta Nipoti, C. Donolato

Keywords:

Minority Carrier Lifetime, Recombination and Trapping Centres, Solid State Detectors

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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