Mössbauer Study of the Electronic and Vibrational Properties of Implanted Te in GaAs and AlxGa1-xAs

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 38-41)

Edited by:

G. Ferenczi

Pages:

1245-1250

DOI:

10.4028/www.scientific.net/MSF.38-41.1245

Citation:

G. Langouche et al., "Mössbauer Study of the Electronic and Vibrational Properties of Implanted Te in GaAs and AlxGa1-xAs", Materials Science Forum, Vols. 38-41, pp. 1245-1250, 1989

Online since:

January 1991

Export:

Price:

$35.00

In order to see related information, you need to Login.