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HomeMaterials Science ForumMaterials Science Forum Vols. 389-393Electrical Characterization of SiC/Si...

Electrical Characterization of SiC/Si Heterostructures with Modified Interfaces

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Silicon Carbide and Related Materials 2001

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Periodical:

Materials Science Forum (Volumes 389-393)

Pages:

355-358

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.389-393.355

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Online since:

April 2002

Authors:

Christian Förster, Pierre M. Masri, Joerg Pezoldt

Keywords:

Electrical Characterization, Heteroepitaxy, Heterojunction, SiC on Si

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© 2002 Trans Tech Publications Ltd. All Rights Reserved

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