Electron-Induced Damage Effects in 4H-SiC Schottky Diodes

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Periodical:

Materials Science Forum (Volumes 433-436)

Edited by:

Peder Bergman and Erik Janzén

Pages:

439-442

Citation:

A. Castaldini et al., "Electron-Induced Damage Effects in 4H-SiC Schottky Diodes", Materials Science Forum, Vols. 433-436, pp. 439-442, 2003

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September 2003

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