OBIC Measurements of 1.3kV 6H-SiC Bipolar Diodes Protected by Junction Termination Extension

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Periodical:

Materials Science Forum (Volumes 433-436)

Edited by:

Peder Bergman and Erik Janzén

Pages:

863-866

DOI:

10.4028/www.scientific.net/MSF.433-436.863

Citation:

S.R. Wang et al., "OBIC Measurements of 1.3kV 6H-SiC Bipolar Diodes Protected by Junction Termination Extension", Materials Science Forum, Vols. 433-436, pp. 863-866, 2003

Online since:

September 2003

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$35.00

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