Paper Title:
Photoemission Spectroscopic Studies on Oxide/SiC Interfaces Formed by Dry and Pyrogenic Oxidation
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 457-460)
Edited by
Roland Madar, Jean Camassel and Elisabeth Blanquet
Pages
1341-1344
DOI
10.4028/www.scientific.net/MSF.457-460.1341
Citation
Y. Hijikata, H. Yaguchi, Y. Ishida, M. Yoshikawa, T. Kamiya, S. Yoshida, "Photoemission Spectroscopic Studies on Oxide/SiC Interfaces Formed by Dry and Pyrogenic Oxidation", Materials Science Forum, Vols. 457-460, pp. 1341-1344, 2004
Online since
June 2004
Export
Price
$35.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.

Authors: Antonella Poggi, Francesco Moscatelli, Andrea Scorzoni, Giovanni Marino, Roberta Nipoti, Michele Sanmartin
Abstract:Many investigations have been conducted on the growth conditions of SiO2 on SiC to improve the oxide quality and the properties of the...
979
Authors: Eric Caudron, Régis Cueff, Christophe Issartel, N. Karimi, Frédéric Riffard, Sébastien Perrier, Henri Buscail
Abstract:Manganese addition and subsequent yttrium implantation effects on extra low carbon steel were studied by Rutherford Backscattering...
897
Authors: Yusuke Kagei, Takashi Kirino, Yuu Watanabe, Shuhei Mitani, Yuki Nakano, Takashi Nakamura, Takuji Hosoi, Takayoshi Shimura, Heiji Watanabe
Abstract:We propose a treatment of nitrogen radical irradiation to 4H-SiC surfaces for improving thermally grown SiO2/SiC interfaces. X-ray...
507
Authors: Biao Zhou, Feng Jin, Qun Luo, Qian Li, Kuo Chih Chou
Chapter 13: Surface Engineering/Coatings
Abstract:The high temperature oxidation and microstructure evolution of 55%Al-Zn-Si coated sheets were studied by scanning electron microscopy (SEM)...
1998
Authors: Norimichi Chinone, Ryoji Kosugi, Yasunori Tanaka, Shinsuke Harada, Hajime Okumura, Yasuo Cho
3.1: SiC-Oxide Interface and MOS Structures Characterisation
Abstract:A new technique for local deep level transient spectroscopy (DLTS) imaging using super-higher-order scanning nonlinear dielectric microscopy...
127