Paper Titles

Initial Oxidation of 6H-SiC (0001) (3 x 3)-R30° and 3 x 3 Surfaces Studied by AES and RHEED
p.1313

Initial Stages of Thermal Oxidation of 4H-SiC (11-20) Studied by Photoelectron Spectroscopy
p.1317

Oxidation Studies of Non-Polar 4H-SiC Surfaces
p.1321

Carbon-Terminated 3C-SiC(100) Surface Oxidation Studied by High-Resolution Core Level Photoemission Spectroscopy using Synchrotron Radiation
p.1325

A Photoemission Study of Polar and Non-Polar SiC Surfaces Oxidized in N₂O
p.1329

Radical Nitridation of Ultra-Thin SiO₂/SiC Structure
p.1333

Ellipsometric Study of Thermal Silicon Oxide and Sacrificial Silicon Oxide on 4H-SiC
p.1337

Photoemission Spectroscopic Studies on Oxide/SiC Interfaces Formed by Dry and Pyrogenic Oxidation
p.1341

Diluted Nitric Oxide (NO) Annealing of SiO₂/4H-SiC in Cold-Wall Oxidation Furnace
p.1345

HomeMaterials Science ForumMaterials Science Forum Vols. 457-460A Photoemission Study of Polar and Non-Polar SiC...

A Photoemission Study of Polar and Non-Polar SiC Surfaces Oxidized in N₂O

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Silicon Carbide and Related Materials 2003

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Periodical:

Materials Science Forum (Volumes 457-460)

Pages:

1329-1332

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.457-460.1329

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Online since:

June 2004

Authors:

Leif I. Johansson, Charíya Virojanadara, Th. Eickhoff, W. Drube

Keywords:

Angle Resolved Photoemission, Oxidation, Silicon Carbide (SiC)

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© 2004 Trans Tech Publications Ltd. All Rights Reserved

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[1] K. Mcdonald, M. B. Huang, R. A. Weller, L. C. Feldman, J. R. Williams, F. C. Stedile, I. J. R. Baumvol, and C. Radtke, Appl. Phys. Lett. Vol. 76 (2000) 568.

DOI: 10.1063/1.125819

[2] W. Drube, H. Schulte-Schrepping, H. -G. Schmidt, R. Treusch, and G. Materlik, Rev. Sci. Instrum. Vol. 66 (1995) 1668.

[3] W. Drube, T. M. Grehk, R. Treusch, and G. Materlik, J. Electron Spectrosc. Relat. Phenom. Vol. 88-89 (1998) 683.

[4] L.I. Johansson, C. Virojanadara, Th. Eickhoff, and W. Drube, Surf. Sci. Vol. 529 (2003) 515.

[5] S. Iwata and A. Ishizaka , J. Appl. Phys. Vol. 79, (1996) 6653 and references therein.

[6] C. Virojanadara and L. I. Johansson, Surf. Sci. Vol. 530 (2003) 17.

[7] C. Virojanadara and L. I. Johansson, Surf. Sci. Vol. 505 (2002) 358.

[8] C. Virojanadara and L. I. Johansson, Phys. Rev. B, in press.