Stacking Fault Formation Sites and Growth in Thick-Epi SiC PiN Diodes

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Materials Science Forum (Volumes 457-460)

Edited by:

Roland Madar, Jean Camassel and Elisabeth Blanquet

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533-536

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R. E. Stahlbush et al., "Stacking Fault Formation Sites and Growth in Thick-Epi SiC PiN Diodes", Materials Science Forum, Vols. 457-460, pp. 533-536, 2004

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June 2004

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DOI: https://doi.org/10.4028/www.scientific.net/msf.457-460.537