Electrochemical C-V Profiling of n-Type 4H-SiC

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Periodical:

Materials Science Forum (Volumes 457-460)

Edited by:

Roland Madar, Jean Camassel and Elisabeth Blanquet

Pages:

681-684

Citation:

K. Zekentes et al., "Electrochemical C-V Profiling of n-Type 4H-SiC", Materials Science Forum, Vols. 457-460, pp. 681-684, 2004

Online since:

June 2004

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DOI: https://doi.org/10.1149/1.1393599

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DOI: https://doi.org/10.4028/www.scientific.net/msf.353-356.619

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