Paper Title:
Electrochemical C-V Profiling of n-Type 4H-SiC
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 457-460)
Edited by
Roland Madar, Jean Camassel and Elisabeth Blanquet
Pages
681-684
DOI
10.4028/www.scientific.net/MSF.457-460.681
Citation
K. Zekentes, M. Kayambaki, S. Mousset, "Electrochemical C-V Profiling of n-Type 4H-SiC", Materials Science Forum, Vols. 457-460, pp. 681-684, 2004
Online since
June 2004
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Price
$35.00
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