Textures of Materials - ICOTOM 14
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Abstract: Allowing for secondary extinction (SE), a method is described for thickness measurement of thin films by x-ray absorption. The method is...
Abstract: One of the design goals of the neutron time-of-flight (TOF) diffractometer HIPPO (HIgh Pressure - Preferred Orientation) at LANSCE (Los...
Abstract: The impact of strong neutron absorption on data analysis and the comparison of two different absorption corrections for neutron diffraction...
Abstract: The aim of the present experiment was to analyse the structural evolution during annealing of Nickel-Titanium (Ni-Ti) SMA subjected to...
Abstract: A new method to investigate thin wires has been tested, which is based on a special sample holder and on a high energy X-rays. Due to the...
Abstract: The new developed “sweeping detector” techniques using high energy synchrotron radiation allow to measure textures and microstructures of...
Abstract: In the paper some aspects of analysis of crystallographic texture concerned to evaluation^of its inhomogeneity have been described. The...