Textures of Materials - ICOTOM 14

Volumes 495-497

doi: 10.4028/www.scientific.net/MSF.495-497

Paper Title Page

Authors: I. Tomov

Abstract: Allowing for secondary extinction (SE), a method is described for thickness measurement of thin films by x-ray absorption. The method is...

Authors: Qiu Lin Wu, Xiao Jun Hu, Kemao Lv, Shu Bo Liu, Zuming Fu, Xiaomin Sun, Jian Min Wang, Limin Li
Authors: Sven C. Vogel, Ch. Hartig, R.B. Von Dreele, H.R. Wenk, D.J. Williams
Authors: J. Pehl, Siegfried Matthies, H.R. Wenk, Luca Lutterotti, Sven C. Vogel

Abstract: One of the design goals of the neutron time-of-flight (TOF) diffractometer HIPPO (HIgh Pressure - Preferred Orientation) at LANSCE (Los...

Authors: Heather M. Volz, Sven C. Vogel, J.A. Roberts, A.C. Lawson, D.J. Williams, L.L. Daemen

Abstract: The impact of strong neutron absorption on data analysis and the comparison of two different absorption corrections for neutron diffraction...

Authors: Andersan S. Paula, Karimbi Koosappa Mahesh, Francisco Manuel Braz Fernandes, Rui Miguel S. Martins, A.M.A. Cardoso, Norbert Schell

Abstract: The aim of the present experiment was to analyse the structural evolution during annealing of Nickel-Titanium (Ni-Ti) SMA subjected to...

Authors: Heinz Günter Brokmeier, Brigitte Weiss, Sang Bong Yi, Wenhai Ye Yi, Klaus Dieter Liss, Thomas Lippmann

Abstract: A new method to investigate thin wires has been tested, which is based on a special sample holder and on a high energy X-rays. Due to the...

Authors: Helmut Klein, Andrea Preusser, Lars Raue, Hans Joachim Bunge

Abstract: The new developed “sweeping detector” techniques using high energy synchrotron radiation allow to measure textures and microstructures of...

Authors: Andrea Preusser, Helmut Klein, Lars Raue, Hans Joachim Bunge
Authors: Jan T. Bonarski

Abstract: In the paper some aspects of analysis of crystallographic texture concerned to evaluation^of its inhomogeneity have been described. The...


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