Deep States Associated with Copper Decorated Oxidation Induced Stacking Faults in Silicon

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 83-87)

Edited by:

Gordon Davies, G.G. DeLeo and M. Stavola

Pages:

1457-1462

Citation:

M. Kaniewska et al., "Deep States Associated with Copper Decorated Oxidation Induced Stacking Faults in Silicon", Materials Science Forum, Vols. 83-87, pp. 1457-1462, 1992

Online since:

January 1992

Export:

Price:

$38.00

Fetching data from Crossref.
This may take some time to load.