Electrical Properties of Oxidation-Induced Stacking Faults in N-Type Silicon

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Periodical:

Materials Science Forum (Volumes 83-87)

Edited by:

Gordon Davies, G.G. DeLeo and M. Stavola

Pages:

1463-1468

Citation:

J. Kaniewski et al., "Electrical Properties of Oxidation-Induced Stacking Faults in N-Type Silicon", Materials Science Forum, Vols. 83-87, pp. 1463-1468, 1992

Online since:

January 1992

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