Characterization of Ion-Implanted Heavily-Doped Silicon by Optical Reflection

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Periodical:

Solid State Phenomena (Volumes 1-2)

Edited by:

D. Stievenard and J.C. Bourgoin

Pages:

1-9

DOI:

10.4028/www.scientific.net/SSP.1-2.1

Citation:

A. Borghesi et al., "Characterization of Ion-Implanted Heavily-Doped Silicon by Optical Reflection", Solid State Phenomena, Vols. 1-2, pp. 1-9, 1988

Online since:

January 1991

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$35.00

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