Electrical Characterization of Buried Layers in Silicon

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Periodical:

Solid State Phenomena (Volumes 1-2)

Edited by:

D. Stievenard and J.C. Bourgoin

Pages:

85-114

Citation:

W. R. Fahrner and E. Klausmann, "Electrical Characterization of Buried Layers in Silicon", Solid State Phenomena, Vols. 1-2, pp. 85-114, 1988

Online since:

January 1991

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Price:

$38.00

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