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In Situ Particle Removal Studies Using an Optical Particle Counter
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Modeling of Shock Wave Emission during Acoustically-Driven Cavitation-Induced Cleaning Processes
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HomeSolid State PhenomenaSolid State Phenomena Vol. 134In Situ Particle Removal Studies Using an Optical...

In Situ Particle Removal Studies Using an Optical Particle Counter

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Periodical:

Solid State Phenomena (Volume 134)

Pages:

189-192

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.134.189

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Cite this paper

Online since:

November 2007

Authors:

D. Martin Knotter, Roy Te Brake, Michiel Enkelaar

Keywords:

Diffusion, Particle Removal, Surfactant

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Сopyright:

© 2008 Trans Tech Publications Ltd. All Rights Reserved

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[1] D. M. Knotter, S. A. M. Wolters, and M. Kasanroijat submitted for publication.

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[1] 2 0 5 10 15 PEG (g/L) effect of surfactant on kb cat-ion non-ion pH 3. 5.

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[1] 6 0 5 10 15 PEG (g/L) effect of surfactant on kb cat-ion non-ion pH 10 Figure 6: Ratio of kb with surfactant / kb without surfactant at different PEG concentrations (average over all temperatures); left pH 3. 5; right at pH 10.