Relaxation Phenomena in Strained Si1-xGex Layers on Planar and Differently Patterned Si Substrates

Abstract:

Article Preview

Info:

Periodical:

Solid State Phenomena (Volumes 32-33)

Edited by:

H.G. Grimmeiss, M. Kittler and H. Richter

Pages:

451-456

DOI:

10.4028/www.scientific.net/SSP.32-33.451

Citation:

E. Bugiel et al., "Relaxation Phenomena in Strained Si1-xGex Layers on Planar and Differently Patterned Si Substrates", Solid State Phenomena, Vols. 32-33, pp. 451-456, 1993

Online since:

December 1993

Export:

Price:

$35.00

In order to see related information, you need to Login.