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HomeSolid State PhenomenaSolid State Phenomena Vols. 51-52Transmission Electron Microscopy Studies of...

Transmission Electron Microscopy Studies of Lattice-Mismatched Semiconductor Heterostructures Used for Integrated Optoelectronic Devices

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Polycrystalline Semiconductors IV

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Periodical:

Solid State Phenomena (Volumes 51-52)

Pages:

131-142

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.51-52.131

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Online since:

May 1996

Authors:

G. Patriarche

Keywords:

Dislocation, Epitaxy, III-V Semiconductor, II-VI Semiconductors, Interface, Lattice Mismatched Heterostructures, Semiconductor Heterostructures, TEM, Wafer Bonding

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© 1996 Trans Tech Publications Ltd. All Rights Reserved

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