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Vols. 57-58

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HomeSolid State PhenomenaSolid State Phenomena Vols. 57-58

Solid State Phenomena Vols. 57-58

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.57-58

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Paper Title Page

Positron Annihilation Rate and Broad Component of 1D-ACAR in Cz-Si and Fz-Si

Authors: N.Yu. Arutyunov

489

Capacitance Spectroscopy of Thin GaAs Layers Grown by Molecular Beam Epitaxy at Low Temperatures

Authors: V.V. Chaldyshev, P.N. Brounkov, A.A. Suvorova, S.G. Konnikov, V.V. Preobrazhenski, M.A. Putyato, B.R. Semyagin

495

Raman Spectroscopy Investigation of Silicon Nanocrystals Formation in Silicon Nitride Films

Authors: Vladimir A. Volodin, M.D. Efremov, V.A. Gritsenko

501

Raman and HREM Observation of Oriented Silicon Nanocrystals Inside Amorphous Silicon Films on Glass Substrates

Authors: M.D. Efremov, V.V. Bolotov, Vladimir A. Volodin, Liudmila I. Fedina, A.A. Gutakovskij, S.A. Kochubei

507

A Model of Coupled Diffusion of Impurity Atoms and Point Defects in the Vicinity of Semiconductor Interfaces and Grain Boundaries

Authors: Oleg Velichko, A.K. Fedotov

513

New Possibility of Impurities Express Determination by Laser Element Spark-Analyzer (LESA)

Authors: T.M. Tkacheva, G.N. Petrov, D.V. Vlasov

519

Analytical Modeling of the Gold Diffusion Induced Modification of the Forward Current through P-N Silicon Junctions

Authors: F. Gaiseanu, M. Sachelarie, D. Sachelarie, Jaume Esteve

525

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