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HomeSolid State PhenomenaSolid State Phenomena Vols. 69-70Improved Microwave Absorption Technique for Bulk...

Improved Microwave Absorption Technique for Bulk and Surface Lifetime Analysis in Processed Si Wafers

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Gettering and Defect Engineering in Semiconductor Technology VIII

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Periodical:

Solid State Phenomena (Volumes 69-70)

Pages:

155-160

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.69-70.155

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Online since:

August 1999

Authors:

Eugenijus Gaubas, Eddy Simoen, Cor Claeys, A. Poyai

Keywords:

Carrier Lifetime, Co-Silicided n⁺p Junction Diodes, Microwave Absorption

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© 1999 Trans Tech Publications Ltd. All Rights Reserved

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