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HomeSolid State PhenomenaSolid State Phenomena Vols. 76-77Gap States at the Interface of Ultra-Thin Oxide...

Gap States at the Interface of Ultra-Thin Oxide and Organic Films on Si(100)

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Abstract:

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Ultra Clean Processing of Silicon Surfaces V

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Periodical:

Solid State Phenomena (Volumes 76-77)

Pages:

131-134

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.76-77.131

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Online since:

January 2001

Authors:

T. Bitzer, T. Rada, N.V. Richardson, T. Dittrich, F. Koch

Keywords:

Gap States, Organic Film/Silicon Interface, Ultra-Thin Oxide

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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