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Paper Titles
Behaviors of Metallic Contaminants in Si Wafer Processing
p.123
Iron Bulk Concentration Effect on the Yield & Reliability of Thin Oxides
p.127
Gap States at the Interface of Ultra-Thin Oxide and Organic Films on Si(100)
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Modification of Low-K SiCOH Film Porosity by a HF Solution
p.135
Layer-By-Layer Oxidation of Silicon
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The Evolution of Chemical Oxides Into Ultrathin Oxides: A Spectroscopic Characterization
p.145
Influence of Boron and Fluorine Incorporation on the Network Structure of Ultrathin SiO2
p.149
The Origins of Fluorine in Dry Ultrathin Silicon Oxides
p.153
Structural and Electrical Characterization of Ultra-Thin SiO2 Films Prepared by Catalytic Oxidation Method
p.157
HomeSolid State PhenomenaSolid State Phenomena Vols. 76-77Layer-By-Layer Oxidation of Silicon

Layer-By-Layer Oxidation of Silicon

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Periodical:

Solid State Phenomena (Volumes 76-77)

Pages:

139-144

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.76-77.139

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Online since:

January 2001

Authors:

Takeshi Hattori, Kazuhiko Takahashi, H. Nohira, Tadahiro Ohmi

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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