Controlling Silicon Surface Roughness During Photochemical Cleaning

Abstract:

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Periodical:

Solid State Phenomena (Volumes 76-77)

Edited by:

Marc Heyns, Marc Meuris and Paul Mertens

Pages:

169-172

DOI:

10.4028/www.scientific.net/SSP.76-77.169

Citation:

J. W. Butterbaugh et al., "Controlling Silicon Surface Roughness During Photochemical Cleaning", Solid State Phenomena, Vols. 76-77, pp. 169-172, 2001

Online since:

January 2001

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Price:

$35.00

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