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Stress Generation and Relaxation in Passivating Films and its New Application in Nanolitography
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High Resolution Surface Characterisation Using STM Light Emission Techniques
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HomeMaterials Science ForumMaterials Science Forum Vols. 185-188High Resolution Surface Characterisation Using STM...

High Resolution Surface Characterisation Using STM Light Emission Techniques

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Passivation of Metals and Semiconductors

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Periodical:

Materials Science Forum (Volumes 185-188)

Pages:

145-154

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.185-188.145

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Online since:

March 1995

Authors:

J. Horn, N. Marx, B.L. Weiss, H.L. Hartnagel, M. Stehle, M.M. Bischoff, H. Pagnia

Keywords:

GaAs, Luminescence, Scanning Tunneling Microscopy, Semiconductor

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© 1995 Trans Tech Publications Ltd. All Rights Reserved

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