Lattice Parameter Measurements of 3C-SiC Thin Films Grown on 6H-SiC(0001) Substrate Crystals

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Periodical:

Materials Science Forum (Volumes 353-356)

Edited by:

G. Pensl, D. Stephani and M. Hundhausen

Pages:

319-322

DOI:

10.4028/www.scientific.net/MSF.353-356.319

Citation:

J. Kräußlich et al., "Lattice Parameter Measurements of 3C-SiC Thin Films Grown on 6H-SiC(0001) Substrate Crystals", Materials Science Forum, Vols. 353-356, pp. 319-322, 2001

Online since:

January 2001

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