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HomeMaterials Science ForumMaterials Science Forum Vols. 389-393Electrical Characterization of Nickel Silicide...

Electrical Characterization of Nickel Silicide Contacts on Silicon Carbide

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Silicon Carbide and Related Materials 2001

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Periodical:

Materials Science Forum (Volumes 389-393)

Pages:

893-896

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.389-393.893

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Online since:

April 2002

Authors:

Fabrizio Roccaforte, Francesco La Via, Vito Raineri, Paolo Musumeci, Lucia Calcagno

Keywords:

Ni₂Si, Ohmic Contact, Schottky Diode, TLM

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© 2002 Trans Tech Publications Ltd. All Rights Reserved

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