Properties of Different Stacking Faults that Cause Degradation in SiC PiN Diodes

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Materials Science Forum (Volumes 433-436)

Edited by:

Peder Bergman and Erik Janzén

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913-916

Citation:

H. Jacobsson et al., "Properties of Different Stacking Faults that Cause Degradation in SiC PiN Diodes ", Materials Science Forum, Vols. 433-436, pp. 913-916, 2003

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September 2003

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DOI: https://doi.org/10.1063/1.1487904

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