Paper Title:
Reliability of 4H-SiC p-n Diodes on LPE Grown Layers
  Abstract

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Periodical
Materials Science Forum (Volumes 433-436)
Edited by
Peder Bergman and Erik Janzén
Pages
929-932
DOI
10.4028/www.scientific.net/MSF.433-436.929
Citation
G. Sarov, R. Kakanakov, T. Cholakova, L. Kassamakova, N. Hristeva, G. Lepoeva, P. Philipova, N.I. Kuznetsov, K. Zekentes, "Reliability of 4H-SiC p-n Diodes on LPE Grown Layers", Materials Science Forum, Vols. 433-436, pp. 929-932, 2003
Online since
September 2003
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