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HomeMaterials Science ForumMaterials Science Forum Vols. 457-460Raman Imaging Characterization of Structural and...

Raman Imaging Characterization of Structural and Electrical Properties in 4H SiC

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Silicon Carbide and Related Materials 2003

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Periodical:

Materials Science Forum (Volumes 457-460)

Pages:

609-612

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.457-460.609

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Online since:

June 2004

Authors:

Michel Mermoux, Alexandre Crisci, Francis Baillet

Keywords:

Carrier Concentration, Mobility, Raman Imaging, Silicon Carbide (SiC)

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© 2004 Trans Tech Publications Ltd. All Rights Reserved

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