Raman Imaging Characterization of Structural and Electrical Properties in 4H SiC

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Periodical:

Materials Science Forum (Volumes 457-460)

Edited by:

Roland Madar, Jean Camassel and Elisabeth Blanquet

Pages:

609-612

Citation:

M. Mermoux et al., "Raman Imaging Characterization of Structural and Electrical Properties in 4H SiC", Materials Science Forum, Vols. 457-460, pp. 609-612, 2004

Online since:

June 2004

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