Effective Edge Termination Design in SiC VJFET

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Periodical:

Materials Science Forum (Volumes 483-485)

Edited by:

Roberta Nipoti, Antonella Poggi and Andrea Scorzoni

Pages:

877-880

DOI:

10.4028/www.scientific.net/MSF.483-485.877

Citation:

P. Bhatnagar et al., "Effective Edge Termination Design in SiC VJFET", Materials Science Forum, Vols. 483-485, pp. 877-880, 2005

Online since:

May 2005

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$35.00

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