Realization of Low On-Resistance 4H-SiC Power MOSFETs by Using Retrograde Profile in P-Body

Abstract:

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Inversion-type 4H-SiC power MOSFETs using p-body implanted with retrograde profiles have been fabricated. The Al concentration at the p-body surface (Nas) is varied in the range from 5×1015 to 2×1018 cm-3. The MOSFETs show normally-off characteristics. While the Ron is 3 cm2 at Eox = (Vg-Vth)/dox ≅ 3 MV/cm for the MOSFET with the Nas of 2×1018 cm-3, the Ron is reduced by a decrease in the Nas and 26 mcm2 is attained for the device with the Nas of 5×1015 cm-3. The inversion channel mobility and threshold voltage are improved with a decrease in the Nas. By modifying the structural parameter of the MOSFET, a still smaller Ron of 7 mcm2 is achieved with a blocking voltage of 1.3 kV.

Info:

Periodical:

Materials Science Forum (Volumes 556-557)

Edited by:

N. Wright, C.M. Johnson, K. Vassilevski, I. Nikitina and A. Horsfall

Pages:

827-830

DOI:

10.4028/www.scientific.net/MSF.556-557.827

Citation:

K. Fujihira et al., "Realization of Low On-Resistance 4H-SiC Power MOSFETs by Using Retrograde Profile in P-Body", Materials Science Forum, Vols. 556-557, pp. 827-830, 2007

Online since:

September 2007

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Price:

$35.00

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