High-Performance Multi-Wafer SiC Epitaxy – First Results of Using a 10x100mm Reactor

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Abstract:

In this paper, we present first results of epitaxial layer deposition using a novel warm-wall CVD multi-wafer system AIX 2800G4 WW from AIXTRON with a capability of processing 10x100mm wafers per run. Intra-wafer and wafer-to-wafer homogeneities of doping and thickness for full-loaded 10x100mm runs will be shown and compared to results of the 6x100mm setup of our hot-wall reactor VP2000HW by AIXTRON used for device production since 2001.

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Materials Science Forum (Volumes 645-648)

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89-94

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April 2010

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© 2010 Trans Tech Publications Ltd. All Rights Reserved

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