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Short-Circuit Capability of SiC Cascode
Abstract:
This work investigates the short-circuit capability of SiC cascode by performing two-dimensional electro-thermal TCAD simulations. The effects of the threshold voltage of the SiC JFET on the cascode short-circuit withstand time are studied. A design trade-off between the JFET specific-on resistance and the cascode short-circuit withstand time is determined. The experimental results are also presented.
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871-874
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Online since:
June 2018
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© 2018 Trans Tech Publications Ltd. All Rights Reserved
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