EBIC and DLTS Study of Deformation Induced Defect Thermal Stability in n-Si

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Periodical:

Solid State Phenomena (Volumes 108-109)

Edited by:

B. Pichaud, A. Claverie, D. Alquier, H. Richter and M. Kittler

Pages:

567-570

DOI:

10.4028/www.scientific.net/SSP.108-109.567

Citation:

O. V. Feklisova and E. B. Yakimov, "EBIC and DLTS Study of Deformation Induced Defect Thermal Stability in n-Si", Solid State Phenomena, Vols. 108-109, pp. 567-570, 2005

Online since:

December 2005

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$35.00

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