Local Measurements of Diffusion Length and Chemical Character of Metal Clusters in Multicrystalline Silicon

Abstract:

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We present a comprehensive description of synchrotron-based analytical microprobe techniques used to locally measure the diffusion length and chemical character of metal clusters in multicrystalline silicon (mc-Si) solar cell material. The techniques discussed are (a) X-ray fluorescence microscopy, capable of determining the spatial distribution, elemental nature, size, morphology, and depth of metal-rich particles as small as 30 nm in diameter; (b) X-ray absorption microspectroscopy, capable of determining the chemical states of these metal-rich precipitates, (c) X-ray beam induced current (XBIC), which maps the minority carrier recombination activity, and (d) Spectrally-resolved XBIC, which maps the minority carrier diffusion length. Sensitivity limits, optimal synchrotron characteristics, and experimental flowcharts are discussed. These techniques have elucidated the nature and effects of metal-rich particles in mc-Si and the physical mechanisms limiting metal gettering from mc-Si, and have opened several promising new research directions.

Info:

Periodical:

Solid State Phenomena (Volumes 108-109)

Edited by:

B. Pichaud, A. Claverie, D. Alquier, H. Richter and M. Kittler

Pages:

577-584

DOI:

10.4028/www.scientific.net/SSP.108-109.577

Citation:

T. Buonassisi et al., "Local Measurements of Diffusion Length and Chemical Character of Metal Clusters in Multicrystalline Silicon", Solid State Phenomena, Vols. 108-109, pp. 577-584, 2005

Online since:

December 2005

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$35.00

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