Hydrogenated Nanocrystalline Silicon Thin Films Studied by Scanning Force Microscopy.

Abstract:

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Hydrogenated nanocrystalline silicon for photovoltaic applications has been investigated. Morphological properties, as well as electrical properties, have been investigated with high spatial resolution by scanning force microscopy analyses (AFM, Atomic Force Microscopy and C-AFM conductive AFM). A major problem regarding the electronic properties is to understand where the current flows. The present contribution aims to clarify which of the material phases mainly contributes to the conduction mechanism.

Info:

Periodical:

Solid State Phenomena (Volumes 131-133)

Edited by:

A. Cavallini, H. Richter, M. Kittler and S. Pizzini

Pages:

547-552

DOI:

10.4028/www.scientific.net/SSP.131-133.547

Citation:

D. Cavalcoli et al., "Hydrogenated Nanocrystalline Silicon Thin Films Studied by Scanning Force Microscopy.", Solid State Phenomena, Vols. 131-133, pp. 547-552, 2008

Online since:

October 2007

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Price:

$35.00

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