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The Effect of Various Process Induced Damages on Wet Etching Rate Difference
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Particle-Substrate Interaction Forces in a Non-Polar Liquid
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Particle-Substrate Interaction Forces in a Non-Polar Liquid

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Periodical:

Solid State Phenomena (Volume 134)

Pages:

165-168

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.134.165

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Online since:

November 2007

Authors:

Francesca Barbagini, Wim Fyen, Jan Van Hoeymissen, Paul W. Mertens, Jan Fransaer

Keywords:

Atomic Force Microscope (AFM), Collodial-Probe, Electrostatic, Low-Polar Solvents, Moisture, Particle

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© 2008 Trans Tech Publications Ltd. All Rights Reserved

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References

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