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HomeSolid State PhenomenaSolid State Phenomena Vols. 82-84Radiation-Induced Electronic Defect Levels in...

Radiation-Induced Electronic Defect Levels in High-Resistivity Si Detectors

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Gettering and Defect Engineering in Semiconductor Technology IX

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Periodical:

Solid State Phenomena (Volumes 82-84)

Pages:

441-446

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.82-84.441

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Online since:

November 2001

Authors:

Edouard V. Monakhov, B.S. Avset, Anders Hallén, Bengt Gunnar Svensson

Keywords:

Deep Level, Defect, Detectors, DLTS, Radiation, Silicon

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© 2002 Trans Tech Publications Ltd. All Rights Reserved

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