Solid State Phenomena Vols. 95-96

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https://doi.org/10.4028/www.scientific.net/SSP.95-96

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Coulomb Blockade in Silicon Nanocrystals Embedded in SiO₂ Matrix

Authors: M.D. Efremov, G.N. Kamaev, G.A. Kachurin, A.V. Kretinin, Vladimir A. Volodin, D.V. Marin, Sofia A. Arzhannikova, V.V. Malutina-Bronskaya, S.G. Yanovskaya

629

Self-Assembled Surface Patterning and Structural Modification upon Femtosecond Laser Processing of Crystalline Silicon

Authors: Florenta Costache, Simona Kouteva-Arguirova, Jürgen Reif

635

Local Dielectric Degradation of Cu-Contaminated SiO₂ Thin Films

Authors: Norio Tokuda, Shingo Nishiguchi, Satoshi Yamasaki, Kazushi Miki, Kikuo Yamabe

641

Process-Induced Changes of the Properties of Silicon Oxide Layers Containing Carbon: A Study of a Low-k Material to be Used in the Interconnection System

Authors: V.D. Akhmetov, Martin Kittler, Winfried Seifert, S. Marschmeyer, Hans Richter, Peter Formanek, J. Doerschel

647

Hafnium Oxide on Silicon: A Non-Destructive Characterization of the Interfacial Layer

Authors: Dirk Wolfframm, Simona Kouteva-Arguirova, Tzanimir Arguirov, R.P. Schmid, K. Dittmar, I Zienert, Jürgen Reif

653

Surface Tension Variation of Silicon Melts with Nitrogen Addition

Authors: Kazutaka Terashima, Mitsuyoshi Sakairi, Muneyuki Hirai, Tomohisa Tsuchiya

659

Prospects for New Wafer Types and Materials in Semiconductor Technology and Factors for their Successful Introduction

Authors: Werner Bergholz, Jürgen Wittmann, Rainer Winkler, Helmut Tews, Roger Fehlhaber

665