Impact Ionization in 6H-SiC MOSFETs

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Periodical:

Materials Science Forum (Volumes 264-268)

Edited by:

G. Pensl, H. Morkoç, B. Monemar and E. Janzén

Pages:

1009-1012

DOI:

10.4028/www.scientific.net/MSF.264-268.1009

Citation:

E. Bano et al., "Impact Ionization in 6H-SiC MOSFETs", Materials Science Forum, Vols. 264-268, pp. 1009-1012, 1998

Online since:

February 1998

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$35.00

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