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HomeMaterials Science ForumMaterials Science Forum Vols. 338-342Performance and Reliability Issues of SiC-Schottky...

Performance and Reliability Issues of SiC-Schottky Diodes

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Silicon Carbide and Related Materials - 1999

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Periodical:

Materials Science Forum (Volumes 338-342)

Pages:

1167-1170

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.338-342.1167

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Online since:

May 2000

Authors:

Roland Rupp, Michael Treu, Anton Mauder, Erich Griebl, Wolfgang Werner, Wolfgang Bartsch, Dietrich Stephani

Keywords:

Electrical Properties, Failure Mechanics, Overcurrent Limitations, Reliability, Schottky Diode

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© 2000 Trans Tech Publications Ltd. All Rights Reserved

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