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HomeMaterials Science ForumMaterials Science Forum Vols. 389-393Electrical Activity of Residual Boron in Silicon...

Electrical Activity of Residual Boron in Silicon Carbide

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Silicon Carbide and Related Materials 2001

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Periodical:

Materials Science Forum (Volumes 389-393)

Pages:

549-552

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.389-393.549

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Online since:

April 2002

Authors:

L. Storasta, Peder Bergman, Erik Janzén, Christer Hallin

Keywords:

Boron, Carrier Lifetime, DLTS, MCTS, Residual Impurities

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© 2002 Trans Tech Publications Ltd. All Rights Reserved

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