Defect Influence on the Electrical Properties of 4H-SiC Schottky Diodes

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Periodical:

Materials Science Forum (Volumes 457-460)

Edited by:

Roland Madar, Jean Camassel and Elisabeth Blanquet

Pages:

1081-1084

Citation:

L. Scaltrito et al., "Defect Influence on the Electrical Properties of 4H-SiC Schottky Diodes", Materials Science Forum, Vols. 457-460, pp. 1081-1084, 2004

Online since:

June 2004

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[6] A. Castaldini et al., Applied Surface Science Vol. 187 (2002) 248-252.

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