Defect Influence on the Electrical Properties of 4H-SiC Schottky Diodes

Luciano Scaltrito; Edvige Celasco; Samuele Porro; Sergio Ferrero; Fabrizio Giorgis; C. Fabrizio Pirri; Denis Perrone; Umberto M. Meotto; P. Mandracci; G. Richieri; Luigi Merlin; Anna Cavallini; Antonio Castaldini; Marco Rossi

doi:10.4028/www.scientific.net/MSF.457-460.1081

Paper Titles

Electrical Properties of pn Diodes on 4H-SiC(000-1) C-Face and (11-20) Face
p.1065

Avalanche Multiplication and Breakdown in 4H-SiC Diodes
p.1069

Investigation of Rapid Thermal Annealed pn-Junctions in SiC
p.1073

Ballistic Electron Emission Microscopy Study of p-Type 4H-SiC
p.1077

Defect Influence on the Electrical Properties of 4H-SiC Schottky Diodes
p.1081

Analysis of Structural Defects in the 4H-SiC Epilayers and their Influence on the Electrical Properties
p.1085

Simulation and Prototype Fabrication of Microwave Modulators with 4H-SiC p-i-n Diodes
p.1089

Bulk SiC Devices for High Radiation Environments
p.1093

2.5KV-30A Inductively Loaded Half-Bridge Inverter Switching using 4H-SiC MPS Free-Wheeling Diodes
p.1097

HomeMaterials Science ForumMaterials Science Forum Vols. 457-460Defect Influence on the Electrical Properties of...

Defect Influence on the Electrical Properties of 4H-SiC Schottky Diodes

Abstract:

You might also be interested in these eBooks

Silicon Carbide and Related Materials 2003

View Preview

Info:

Periodical:

Materials Science Forum (Volumes 457-460)

Pages:

1081-1084

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.457-460.1081

Citation:

Cite this paper

Online since:

June 2004

Authors:

Luciano Scaltrito, Edvige Celasco, Samuele Porro, Sergio Ferrero, Fabrizio Giorgis, C. Fabrizio Pirri, Denis Perrone, Umberto M. Meotto, P. Mandracci, G. Richieri, Luigi Merlin, Anna Cavallini, Antonio Castaldini, Marco Rossi

Keywords:

Deep Level Transient Spectroscopy, Defect, Electrical Characterization, Schottky Diode

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

Citation:

References

[1] I. Kamata et al., Materials Science Forum (2001) 1137-1140.

Google Scholar

[2] Q. Wahab et al., Applied Physics Letters, 73, 19 (2000) 2725-2727.

Google Scholar

[3] L. Scaltrito et al. Journal of Physics: Condensed Matter 14 (2002) 13397-13402.

Google Scholar

[4] C. Sudre et al., Materials Science Forum (2000) 338-342.

Google Scholar

[5] L. Scaltrito et al., Materials Science Forum 433-436 (2003) 455-458.

Google Scholar

[6] A. Castaldini et al., Applied Surface Science Vol. 187 (2002) 248-252.

Google Scholar

[7] N. Achtziger, W. Witthuhn, Appl. Phys. Lett. Vol. 71 (1997).

Google Scholar