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Solid State Phenomena
Vols. 80-81
Solid State Phenomena
Vols. 78-79
Solid State Phenomena
Vols. 76-77
Solid State Phenomena
Vols. 73-75
Solid State Phenomena
Vol. 72
Solid State Phenomena
Vol. 71
Solid State Phenomena
Vols. 69-70
Solid State Phenomena
Vols. 67-68
Solid State Phenomena
Vols. 65-66
Solid State Phenomena
Vols. 63-64
Solid State Phenomena
Vols. 61-62
Solid State Phenomena
Vols. 59-60
Solid State Phenomena
Vols. 57-58

Solid State Phenomena Vols. 69-70

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.69-70

ToC:

Table of Contents

Paper Title Page

Electron Spin Resonance of the Pb Centers Associated with Oxygen Precipitates in Silicon Crystals
Authors: Hiroshi Yamada-Kaneta, M. Koizuka
485
Structural and Electrical Quality of Silicon Bicrystals Fabricated by a Modified Direct Bonding Technique
Authors: T.S. Argunova, Mikhail Yu. Gutkin, L.S. Kostina, T.V. Kudriavtseva, Eun Dong Kim, Sang Cheol Kim
491
Formation of Spatial Inhomogeneities as a Result of Heat Treatment in Silicon Doped with Zinc
Authors: Ekaterina V. Astrova, V.B. Voronkov, Alexander A. Lebedev, A.N. Lodygin, A.D. Remenyuk
497
Magnetoplastic Effect in Compound Semiconductors
Authors: E.V. Darinskaya, E.A. Petrzhik, S.A. Erofeeva, V.P. Kisel
503
Reconstruction of GaAs/AlAs (311) and (100) Interfaces: Raman Study
Authors: M.D. Efremov, Vladimir A. Volodin, V.V. Bolotov, V.A. Sachkov, G.A. Lubas, V.V. Preobrazhenski, B.R. Semyagin
507
Simulation of Point Defect Diffusion in Semiconductors
Authors: Oleg Velichko, A.K. Fedotov
513
Correlation between Intrinsic Stress Distribution and Crystallographic Defects Density Profile in Czochralski Silicon after CMOS Processing
Authors: T. Piotrowski, W. Jung
519
Silicon Impurity-Related Effects on Structural Defects in III-V Nitrides
Authors: N. Shmidt, V. Busov, Valentin V. Emtsev, R. Kyutt, W. Lundin, D.S. Poloskin, V.V. Ratnikov, A.V. Sakharov, A. Usikov
525
Reconstruction of Deep Level Defect Distribution from DLTS Measurements in Compensated Semiconductors
Authors: O.A. Soltanovich, Eugene B. Yakimov, Nikolai Yarykin
531
Identification of Process Induced Defects in Silicon Power Devices
Authors: Ekaterina V. Astrova, V.A. Kozlov, Alexander A. Lebedev, V.B. Voronkov
539

Showing 71 to 80 of 89 Paper Titles

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