For Libraries For Publication Open Access Downloads About Us Contact Us
Volumes
Solid State Phenomena
Vols. 80-81
Solid State Phenomena
Vols. 78-79
Solid State Phenomena
Vols. 76-77
Solid State Phenomena
Vols. 73-75
Solid State Phenomena
Vol. 72
Solid State Phenomena
Vol. 71
Solid State Phenomena
Vols. 69-70
Solid State Phenomena
Vols. 67-68
Solid State Phenomena
Vols. 65-66
Solid State Phenomena
Vols. 63-64
Solid State Phenomena
Vols. 61-62
Solid State Phenomena
Vols. 59-60
Solid State Phenomena
Vols. 57-58

Solid State Phenomena Vols. 69-70

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.69-70

ToC:

Table of Contents

Paper Title Page

Experimental and Theoretical Study on Interaction Processes for 60° Short Dislocation Segments with Precipitation Centers in Si-Crystals
Authors: V.A. Makara, L.P. Steblenko, A.N. Kolomiets
423
Ultrasonic Influence on Dislocation Dynamics in Silicon
Authors: I. Ostrovskii, L.P. Steblenko, A.B. Nadtochii
429
P-N- Junction Peripheral Current Analysis using Gated Diode Measurements
Authors: A. Czerwinski, Eddy Simoen, A. Poyai, Cor Claeys
437
Investigations of Extended Defects after Sulfur Diffusion in GaAs
Authors: N. Engler, H.S. Leipner, R.F. Scholz, P. Werner, F. Syrowatka, Jürgen Schreiber, U.M. Gösele
443
On the Reduction of the Critical Thickness in InxGa1-xAs Quantum Well Layers Grown on Vicinal GaAs Substrates
Authors: Cesare Frigeri, A. Brinciotti, D.M. Ritchie, G.P. Donzelli
449
Extraction of Vacancy Parameters from Outdiffusion of Zinc from Silicon
Authors: P. Pichler
455
Cu Determination in Silicon Wafers: A Comparison between Electrical and Chemical Measurements
Authors: Vito Raineri, D. Cali, M. Camalleri, M. Di Dio, A. Puglisi
461
Single Defect Studies by Means of Random Telegraph Signals in Submicron Silicon MOSFETs
Authors: Eddy Simoen, Cor Claeys, N.B. Lukyanchikova, M.V. Petrichuk, N.P. Garbar
467
Variations of Silicon Melt Convection in a Crucible with Boron Addition
Authors: Koichi Terashima, Seigo Nishimura
473
Electrical Impedance Spectroscopy (EIS) as a New Characterisation Tool for the Determination of Electrical Material Parameters in Semiconductors and Insulators
Authors: P. Viscor, M. Jensen, J. Vedde
479

Showing 61 to 70 of 89 Paper Titles

© 2025 Trans Tech Publications Ltd. All rights are reserved, including those for text and data mining, AI training, and similar technologies. For open access content, terms of the Creative Commons licensing CC-BY are applied.
Scientific.Net is a registered trademark of Trans Tech Publications Ltd.