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Infrared Reflectance of Extremely Thin AlN Epi-Films Deposited on SiC Substrates
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Cathodoluminescence of Defect Regions in SiC Epi-Films
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Contactless Measurement of the Thermal Conductivity of Thin SiC Layers
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HomeMaterials Science ForumMaterials Science Forum Vols. 264-268Cathodoluminescence of Defect Regions in SiC...

Cathodoluminescence of Defect Regions in SiC Epi-Films

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Periodical:

Materials Science Forum (Volumes 264-268)

Pages:

653-656

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.264-268.653

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Online since:

February 1998

Authors:

Mike F. MacMillan, L. Hultman, Christer Hallin, Ivan G. Ivanov, Anne Henry, Erik Janzén, S.A. Galloway

Keywords:

3C Defect Regions, Cathodoluminescence, Micropipe

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© 1998 Trans Tech Publications Ltd. All Rights Reserved

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