AFM and Raman Studies of Graphene Exfoliated on SiC
We report an investigation of few layers graphene exfoliated on SiC. Using AFM and Raman spectroscopy, we find that the graphene thickness determined from the normalized intensity of Raman lines significantly depart from the one obtained using XPS.
Amador Pérez-Tomás, Philippe Godignon, Miquel Vellvehí and Pierre Brosselard
A. Tiberj et al., "AFM and Raman Studies of Graphene Exfoliated on SiC", Materials Science Forum, Vols. 615-617, pp. 215-218, 2009