AFM and Raman Studies of Graphene Exfoliated on SiC

Abstract:

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We report an investigation of few layers graphene exfoliated on SiC. Using AFM and Raman spectroscopy, we find that the graphene thickness determined from the normalized intensity of Raman lines significantly depart from the one obtained using XPS.

Info:

Periodical:

Materials Science Forum (Volumes 615-617)

Edited by:

Amador Pérez-Tomás, Philippe Godignon, Miquel Vellvehí and Pierre Brosselard

Pages:

215-218

DOI:

10.4028/www.scientific.net/MSF.615-617.215

Citation:

A. Tiberj et al., "AFM and Raman Studies of Graphene Exfoliated on SiC", Materials Science Forum, Vols. 615-617, pp. 215-218, 2009

Online since:

March 2009

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Price:

$35.00

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