Solid State Phenomena
Vol. 138
Vol. 138
Solid State Phenomena
Vol. 137
Vol. 137
Solid State Phenomena
Vol. 136
Vol. 136
Solid State Phenomena
Vol. 135
Vol. 135
Solid State Phenomena
Vol. 134
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Solid State Phenomena
Vols. 131-133
Vols. 131-133
Solid State Phenomena
Vol. 130
Vol. 130
Solid State Phenomena
Vol. 129
Vol. 129
Solid State Phenomena
Vol. 128
Vol. 128
Solid State Phenomena
Vol. 127
Vol. 127
Solid State Phenomena
Vols. 124-126
Vols. 124-126
Solid State Phenomena
Vols. 121-123
Vols. 121-123
Solid State Phenomena
Vol. 120
Vol. 120
Solid State Phenomena Vol. 130
Paper Title Page
Abstract: Application of the Rietveld method to quantitative phase analysis of fly ashes from Polish
power stations is presented. The calculations of the fractions of crystalline components as well as
non crystalline constituents have been done using SIROQUANT TM software. The power of the
Rietveld refinement is shown when very small contents of minerals are detected and quantified.
277
Abstract: Grazing incident X-ray diffraction technique was applied to determine the influence of
incident beam angle (α angle) on structural parameters as well as peak profile. X-ray diffraction
patterns were registered in asymmetrical geometry, in which a parallel beam was formed by Soller
and divergence slits. Lowering of the α angle results in accuracy decrease of lattice parameters as
well as in significant broadening of a half-width of X-ray diffraction line.
281
Abstract: In structure studies performed using the Grazing Incident X-ray Diffraction Geometry
(GIXD) for different incident angles it was indicated that the Si-N layers are non-homogenous and
their structure depends on the penetration depth. The layers close to substrate (α = 2, 1°) show the
presence of the Si3N4, SiO2, SiO2, SiC phases and an amorphous Si-N phase as well. The layers near
the surface (α = 0.5; 0.25; 0.15°) are poorer in Si-N phases. There are only observed the presence of
the Si3N4 and SiO2 phases. The obtained results confirm the non-homogenity of layers.
287
Abstract: The X-ray reflectivity measurements were used for the analyses of the SiC and SiN thin
layers. Density, roughness and the thickness were determined for searching materials. The
calculations and simulations were carried out using the WinGixa software. The obtained results
show that the studied layers are non-homogenous and there are consist of “sub-layers” rich in Si-C,
Si-N, SI-O phases. Moreover, the presence of the main amorphous phase was observed in all
searching samples.
293
Abstract: Phase transitions occurring in the Al2O3-ZrO2 composite as a result of plasma
spraying and subsequent coating annealing are described. X-ray diffraction and transmission
electron microscopy methods are applied to study these effects. Separate layers of amorphous,
nano- and fine-crystalline structure with the columnar crystals areas have been observed.
Thermal treatment causes formation of more ordered phases. Effect of partial stabilization of
cubic and tetragonal zirconia due to the presence of alumina has been remarked.
297