Volumes

Materials Science Forum
Vol. 214

Materials Science Forum
Vols. 210-213

Materials Science Forum
Vols. 207-209

Materials Science Forum
Vols. 204-206

Materials Science Forum
Vol. 203

Materials Science Forum
Vol. 202

Materials Science Forum
Vols. 196-201

Materials Science Forum
Vol. 195

Materials Science Forum
Vols. 192-194

Materials Science Forum
Vol. 191

Materials Science Forum
Vols. 189-190

Materials Science Forum
Vols. 185-188

Materials Science Forum
Vols. 182-184

HomeMaterials Science ForumMaterials Science Forum Vols. 196-201

Materials Science Forum Vols. 196-201

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.196-201

Export:

ToC:

Table of Contents

Paper Title Page

Genration of Oxidation Induced Stacking Faults in CZ Silicon Wafers

Authors: Koji Sueoka, M. Akatsuka, K. Nishihara, T. Yamamoto, S. Kobayashi

1737

Relation between Minute Lattice Strain and Anomalous Oxygen Precipitation in a Czochralski-Grown Silicon Crystal

Authors: Shigeru Kimura, Taeko Ikarashi, Akio Tanikawa, Tetsuya Ishikawa

1743

Photoluminescence Due To Oxygen Precipitates Distinguished from the D Lines in Annealed Si

Authors: Michio Tajima, Masao Tokita, M. Warashina

1749

Lattice Defects in High Quality As-Grown CZ Silicon, Studied with Ligth Scattering and Preferential Etching Techniques

Authors: Jan Vanhellemont, G. Kissinger, D. Gräf, Karine Kenis, M. Depas, Paul W. Mertens, U. Lambert, Marc Heyns, Cor Claeys, Hans Richter, P. Wagner

1755

Microdefects in Nitrogen Doped FZ Silicon Revealed by Li⁺ Drifting

Authors: W.B. Knowlton, J.T. Walton, J.S. Lee, Y.K. Wong, Eugene E. Haller, Wilfried von Ammon, W. Zulehner

1761

Influence of Al Doping on Deep Levels in MBE GaAs

Authors: Umar S. Qurashi, M. Zafar Iqbal, N. Baber, T.G. Andersson

1767

Deep Donor - Acceptor Correlations in Low Temperature GaAs

Authors: K. Korona, Maria Kaminska, Jacek M. Baranowski

1773

Dislocation Reduction of GaAs and AIGaAs on Si Substrate for High Efficiency Solar Cell

Authors: T. Soga, M Yang, Tomohisa Kato, Takashi Jimbo, Masayoshi Umeno

1779

Spatial Distribution of Microdefects around Dislocations in Si-Doped GaAs

Authors: R. Toba, M. Warashina, Michio Tajima

1785

Study of the Dislocation Atmospheres in N-Type GaAs by DSL Photoetching, EBIC and Microraman Measurements

Authors: P. Martín, J. Jiménez, Cesare Frigeri, J. Weyher, K. Sonnenberg

1791