Materials Science Forum Vols. 353-356

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.353-356

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Table of Contents

Paper Title Page

Effects of Hydrogen Implantation and Annealing on the Vibrational Properties of 6H-SiC

Authors: H.W. Kunert, T.P. Maurice, T. Hauser, Johan B. Malherbe, L.C. Prinsloo, D.J. Brink, L.A. Falkovsky, Jean Camassel

275

4H- and 6H-SiC Rutherford Back Scattering-Channeling Spectrometry: Polytype Finger Printing

Authors: Roberta Nipoti, A. Carnera

279

X-ray Diffraction, Micro-Raman and Birefringence Imaging of Silicon Carbide

Authors: Etienne Pernot, Michel Mermoux, J. Kreisel, O. Chaix-Pluchery, Petra Pernot-Rejmánková, Mikhail Anikin, Bernard Pelissier, A.M. Glazer, Roland Madar

283

X-Ray Diffraction Line Profile Analysis of Neutron Irradiated 6H-SiC

Authors: Christoph Seitz, Andreas Magerl, Hans Heissenstein, Reinhard Helbig

287

High-Resolution XRD Evaluation of Thick 4H-SiC Epitaxial Layers

Authors: Henrik Jacobsson, Rositza Yakimova, Mikael Syväjärvi, Jens Birch, T.O. Tuomi, Erik Janzén

291

Defect Analysis of SiC Sublimation Growth by the In-Situ X-Ray Topography

Authors: Tomohisa Kato, Naoki Oyanagi, Hirotaka Yamaguchi, Shin Ichi Nishizawa, Kazuo Arai

295

Crystal Defects as Source of Anomalous Forward Voltage Increase of 4H-SiC Diodes

Authors: Peder Bergman, H. Lendenmann, Per Åke Nilsson, Ulf Lindefelt, P. Skytt

299

A Simple Non-Destructive Technique to Detect Micropipes in Silicon Carbide

Authors: D.J. Morrison, A. Keir, I.H. Preston, Keith P. Hilton, Michael J. Uren, C. Mark Johnson

303

Micropipe and Macrodefect Healing in SiC Crystals during Liquid Phase Processing

Authors: Boris M. Epelbaum, Dieter Hofmann, U. Hecht, Albrecht Winnacker

307

Micropipe Closing via Thick 4H-SiC Epitaxial Growth Involving Structural Transformation of Screw Dislocations

Authors: Isaho Kamata, Hidekazu Tsuchida, Tamotsu Jikimoto, Kunikaza Izumi

311