Growth of Device Quality 4H-SiC High Velocity Epitaxy

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Materials Science Forum (Volumes 457-460)

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201-204

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June 2004

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© 2004 Trans Tech Publications Ltd. All Rights Reserved

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[1] O. Kordina, K. Irvine, J. Sumakeries, H.S. Kong, M.J. Paisley and C.H. Carter, Jr.: Mater. Sci. Forum Vol. 264-268 (1998), p.107.

Google Scholar

[2] M. Syväjärvi, R. Yakimova, H. Jacobsson, M.K. Linnarsson, A. Henry and E. Janzén: Mater. Sci. Forum Vol. 338-342 (2000), p.165.

DOI: 10.4028/www.scientific.net/msf.338-342.165

Google Scholar

[3] M. Syväjärvi, R. Yakimova, H. Jacobsson, and E. Janzén: J. Appl. Phys. Vol. 88 (2000), p.1407.

Google Scholar